Meetings/Workshops on Clusters, Nanomaterials, Graphene and Fullerenes in Belgium

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First International Workshop on Imaging Ellipsometry
18 May 2020 - 20 May 2020 • Mons, Belgium
Organizer:
University of Mons, Faculty of Science
Abstract:
The first international workshop on Imaging Ellipsometry (IEW2020) aims at providing a forum for scientists and engineers working in instrumentation and applications of Imaging Ellipsometry (IE) and related techniques IEW2020 is a joint organisation of UMONS (Prof. M. Voué, Materials Research Institute, LPMO) and UCLouvain (Prof. A. Jonas, IMCN). In order to maximize the interactions, four sessions will be scheduled on a serial scheme. Please visit our Website to learn more!
Contact:
Event Secretariat;     Phone: [+32 (0) 65373301];     Email: iew2020@umons.ac.be
Topics:
Ellipsometry, Imaging Ellipsometry, 2D materials, Optical properties of 2D materials, Bioactive coatings and biointerfaces, Functional organic layers for applications in electronics, optics and Energy, Hybrid and composite material, nanoparticals, patterned thin films, Brewster Angle Microscopy
Event listing ID:
1338644


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Last updated: 04 March 2020