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Title
DFT — 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
23 Oct 2017 - 25 Oct 2017 • Cambridge, United Kingdom
Abstract
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field.
Event listing ID
896550
Event website

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