Konferenzen  >  Ingenieurwissenschaften  >  Elektronik  >  Deutschland

Keysight Technologies

This seminar provides an in-depth overview of RF device characterization techniques essential for evaluating the performance of components such as amplifiers, mixers, and filters. Participants will learn how to accurately measure key parameters like gain, noise figure, EVM, and phase noise using advanced tools and methods. The session also covers practical calibration strategies and introduces Keysight's unique solutions for precise and repeatable measurements in both R&D and production environments.

Events Keysight;     Tel.: [+4915226977351];     Email: anna.walter@keysight.com

Noise Figure Measurement, Y-Factor Method, Cold Source Method, Signal-to-Noise Ratio (SNR), System Noise Performance, Noise Calibration, VNA-based Noise Measurements, Modulation Distortion Analysis, EVM Optimization, Phase Noise Measurement, Load-Pull Techniques, IQ Data Streaming, Wideband Signal Analysis, High-Frequency Component Design, EDA Software, System Simulation & Modeling, Phased-Array Systems, Beamforming Systems

Keysight Technologies Deutschland GmbH

The RF Back-to-Basics seminar provides a practical introduction to key RF measurement techniques. Topics include spectrum and signal analysis, vector signal generation, network analysis, and impedance analysis—each explained with hands-on examples. Ideal for beginners and those looking to refresh their knowledge.

Tel.: [+49 1522 6977351];     Email: anna.walter@keysight.com

RF basics, spectrum analysis, signal analysis, vector signal generation, network analysis, impedance analysis, measurement techniques