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LEEM-PEEM is a biennial meeting reviewing the status of surface microscopies that employ low energy electrons. The meeting promotes and disseminates applications of surface microscopies such as LEEM, PEEM, SPLEEM, SPELEEM, XPEEM and related techniques to a broad audience of interested scientists. The workshop highlights the most recent scientific advances as well as instrumental developments. Topics will cover surfaces, thin films, organic films, surface chemistry, magnetism, time resolved methods, instrumental advances and novel applications of LEEM and PEEM to other subject areas.

LEEM, PEEM, SPLEEM, SPELEEM, XPEEM

Magnetismus, Spintronik,    Mikroskopie

SPIE – The International Society for Optics and Photonics

Participate in the meeting where the latest research in advanced materials and sensor systems for NDE and structural health monitoring, automotive, aerospace, civil infrastructure, and Industry 4.0 are presented to the sensors community.

The meeting for advanced materials and sensor systems.