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LEEM-PEEM is a biennial meeting reviewing the status of surface microscopies that employ low energy electrons. The meeting promotes and disseminates applications of surface microscopies such as LEEM, PEEM, SPLEEM, SPELEEM, XPEEM and related techniques to a broad audience of interested scientists. The workshop highlights the most recent scientific advances as well as instrumental developments. Topics will cover surfaces, thin films, organic films, surface chemistry, magnetism, time resolved methods, instrumental advances and novel applications of LEEM and PEEM to other subject areas.

LEEM, PEEM, SPLEEM, SPELEEM, XPEEM

Messtechnik,    Mikroskopie