Meetings/Workshops on Metrology and Instrumentation in Belgium
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The Future of MOS Technologies
20 Apr 2020 - 22 Apr 2020 • Brussels, Belgium
The technologies required to enable large spectroscopic surveys are one of the most challenging in astronomical instrumentation: instruments need to be accurate, with micrometer positioning accuracy and repeatability; fast, to minimize overheads; robust, to minimize failure; and low cost.
First International Workshop on Imaging Ellipsometry
18 May 2020 - 20 May 2020 • Mons, Belgium
University of Mons, Faculty of Science
The first international workshop on Imaging Ellipsometry (IEW2020) aims at providing a forum for scientists and engineers working in instrumentation and applications of Imaging Ellipsometry (IE) and related techniques IEW2020 is a joint organisation of UMONS (Prof. M. Voué, Materials Research Institute, LPMO) and UCLouvain (Prof. A. Jonas, IMCN). In order to maximize the interactions, four sessions will be scheduled on a serial scheme. Please visit our Website to learn more!
Event Secretariat; Phone: [+32 (0) 65373301]; Email: firstname.lastname@example.org
Ellipsometry, Imaging Ellipsometry, 2D materials, Optical properties of 2D materials, Bioactive coatings and biointerfaces, Functional organic layers for applications in electronics, optics and Energy, Hybrid and composite material, nanoparticals, patterned thin films, Brewster Angle Microscopy
EXRS 2020 — European X-ray Spectrometry Conference
21 Jun 2020 - 26 Jun 2020 • Brugge, Belgium
European Microbeam Analysis Society (MAS)
The University of Antwerp (AXES group), together with Ghent University (XMI group) and Liege University (CEA) have the pleasure of inviting you to the 2020 edition of the European X-ray Spectrometry conference. This edition of the EXRS conference, organised in collaboration with the European Microbeam Analysis Society (EMAS), will take place in the historic city centre of Bruges (Belgium), which is listed as UNESCO world heritage. The European Conference on X-ray Spectrometry (EXRS) is a biennial conference series that started in 1984 in Gothenburg, Sweden.
Interactions of X-rays with matter and fundamental parameters;- Quantification, simulation and modelling;- XRS instrumentation (sources, optics and ED/WD detectors, including mobile devices);- TXRF and related techniques;- PIXE and electron induced XRS;- Synchrotron radiation;- Microbeams and scanning imaging techniques;- Full field X-ray imaging and tomography;- X-ray absorption and emission spectroscopy; X-ray diffraction;- XRS applications in biology/health, environment, industrial production, cultural heritage, nanotechnology, energy,
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Last updated: 04 March 2020