Meetings/Workshops on Metrology and Instrumentation in China

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1
3M-NANO — International Conference IEEE 3M-NANO 2019
04 Aug 2019 - 08 Aug 2019 • Zhenjiang, China
Abstract:
3M-NANO is the annual International Conference on Manipulation, Manu­facturing and Measurement on the Nanoscale
Event listing ID:
1160824
Related subject(s):
2
School on Quantum Metrology, Precision Measurements, and Fundamental Constants
05 May 2020 - 09 May 2020 • Wuhan, China
Event listing ID:
1242556

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AIP Conference Proceedings
Last updated: 28 June 2019