Meetings/Workshops on Microscopy in the Netherlands

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1
ELMI2021 Meeting — 20th International European Light Microscopy Initiative Meeting
22 Jun 2021 - 25 Jun 2021 • Noordwijkerhout, Netherlands
Abstract:
Due to the COVID-19 pandemic, the ELMI2020 meeting in Noordwijkerhout has been postponed to June 22-25 2021, also in Noordwijkerhout, the Netherlands. The originally planned ELMI2021 in Finland will, likewise, be postponed by one year, and will take place in 2022 in Turku, Finland. We are thankful for your understanding and hope to meet you at ELMI2021!
Event listing ID:
1384446
Event website:
2
9th International Conference on Electron Tomography
12 Sep 2021 - 15 Sep 2021 • Egmond aan Zee, Netherlands
Abstract:
The 9thelectron tomography congress will bring together the leading experts in hardware development, software development, and the diverse set of applications of electron tomography, particularly in biology.
Topics:
Topics covered will include: • Recent developments in tomography of large volume samples via FIB milling • Correlative light and electron microscopy • Automatic tilt-series acquisition and reconstruction softwares • High-throughput, large-scale reconstructions of plastic embedded samples • Latest developments in sub-tomogram classification and averaging • Map interpretation, model fitting and animations • Example of recent high impact biological results through tomography
Event listing ID:
1383156
Event website:
3
PICO 20222
08 May 2022 - 12 May 2022 • Kasteel Vaalsbroek, Netherlands
Abstract:
Frontiers of Aberration-corrected Electron Microscopy is a series of biennial conferences focusing on fundamental electron optics and it's applications to advanced transmission electron microscopy techniques being applied to the study of solid state research phenomena and the life sciences. The conference series primarily arose to satisfy the requirements of the electron microscopy community working on solid state problems at the atomic scale, which grew explosively in the early 2000's with the introduction of aberration corrector units in commercial instruments and has expanded since to researchers working with analytical periphery, at low acceleration voltages or making use of various in-situ techniques.
Topics:
advanced electron microscopy research
Event listing ID:
1384484


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Last updated: 26 October 2020